Three-dimensional depth-resolved and extended-resolution micro-particle characterization by holographic light scattering spectroscopy
Gutzler, Thomas Hillman, Timothy R. Alexandrov, Sergey Sampson, David D.
Gutzler, Thomas
Hillman, Timothy R.
Alexandrov, Sergey
Sampson, David D.
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Identifiers
http://hdl.handle.net/10379/17117
https://doi.org/10.13025/15594
https://doi.org/10.13025/15594
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Publication Date
2010
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Article
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Citation
Gutzler, Thomas, Hillman, Timothy R., Alexandrov, Sergey A., & Sampson, David D. (2010). Three-dimensional depth-resolved and extended-resolution micro-particle characterization by holographic light scattering spectroscopy. Optics Express, 18(24), 25116-25126. doi: 10.1364/OE.18.025116
Abstract
Fourier-holographic light scattering spectroscopy is applied to record complex angular scattering spectra of two- and three-dimensional samples over a wide field of view. We introduce a computational depth sectioning technique and, for the first time, demonstrate that a single-exposure hologram can generate a quantitative, three-dimensional map of particle sizes and locations over several cubic millimeters with micrometer resolution. Such spatially resolved maps of particle sizes are generated by Mie-inversion and could not be ascertained from the directly reconstructed intensity-distribution images. We also demonstrate synthesis of multiple angular scattering intensity spectra to increase the angular range and improve size detection sensitivity.
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Publisher
Optica
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CC BY-NC-ND 3.0 IE