Publication

Label free ultra-sensitive imaging with sub-diffraction spatial resolution

Alexandrov, Sergey
; 
Das, Nandan
; 
McGrath, James
; 
Owens, Peter
; 
Sheppard, Colin J. R.
; 
Boccafoschi, Francesca
; 
Giannini, Cinzia
; 
Sibillano, Teresa
; 
Subhash, Hrebesh
; 
Leahy, Martin
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Publication Date
2019-07-09
Keywords
optical microscopy, label free imaging, nano-sensitivity, super-resolution, spatial frequency, Spatial resolution, Microscopy, Optical microscopy, Optical imaging, Optical diffraction
Type
Conference Paper
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Citation
Alexandrov, Sergey, Das, Nandan, McGrath, James, Owens, Peter, Sheppard, Colin J. R., Boccafoschi, Francesca, Giannini, Cinzia, Sibillano, Teresa, Subhash, Hrebesh, Leahy, Martin. (2019). Label free ultra-sensitive imaging with sub-diffraction spatial resolution. Paper presented at the 21st International Conference on Transparent Optical Networks, ICTON’2019, Angers, France, 09-13 July.
Abstract
In this paper, we show a new way to break the resolution limit and dramatically improve sensitivity to structural changes. To realize it we developed a novel label free contrast mechanism, based on the spectral encoding of spatial frequency (SESF) approach. The super-resolution SESF (srSESF) microscopy is based on reconstruction of the axial spatial frequency (period) profiles for each image point and comparison of these profiles to form super-resolution image. As a result, the information content of images is dramatically improved in comparison with conventional microscopy. Numerical simulation and experiments demonstrate significant improvement in sensitivity and resolution.
Funder
Horizon 2020
Galway University Foundation
Irish Research Council
Publisher
IEEE
Publisher DOI
10.1109/ICTON.2019.8840220
Rights
Attribution-NonCommercial-NoDerivs 3.0 Ireland
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Collections
School of Physics (Conference Papers)